Scalable Test Solutions: A Means of Improving ASIC Performance and Time-to-Market in Mixed-Signal Engineering Test

In a quest for shorter time-to-market and higher test quality of complex mixed-signal ICs, a novel approach for Mixed-Signal Engineering Test and Low Volume Production Test is devised. The approach builds upon making available to designers a scalable approach for engineering test of mixed-signal ASICs where the low cost entry starts at using standard off-the-shelves lowcost PC-plugin instrumentation and scales upwards to VXI based instrumentation, when performance demands increase in terms of test instrumentation fidelity and/or volume throughput requirements. The high end of the solution approach meets the demands of medium size